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送料無料 日付更新(2017年7月)

修正:1,000円以上の注文で3%OFFクーポン(0818-22)

目次

SEMの新しい世界

SEMの新しい世界

  • 清水 健一(著)/ 三谷 智明(著)
  • (1)Lateral resolution in in‐lens SE and high angle BSE imaging at low accelerating voltages,below 2.0kV
  • (2)Z‐contrast sensitivity in low‐voltage,high angle BSE imaging
  • (3)Information depth in low‐voltage,high angle BSE imaging
  • (4)Nano inclusions in Co‐hardened gold plating for electronic applications‐further evidence for high lateral resolution in low‐voltage,high angle BSE imaging
  • (5)A thin layer of organic contaminant on the surface of mirror‐polished Al based hard disks
  • (6)A further potential of ultra‐low‐voltage in‐lens SE imaging
  • (7)Sample surface preparation by ultramicrotomy using a diamond knife for cross‐sectional examination of various coatings on metals
  • (8)Cross‐sectional examination of a galvanized steel
  • (9)Cross‐sectional examination of a painted steel
  • (10)Cross‐sectional examination of solder joint of a printed circuit board
  • (11)Cross‐sectional examination of a tin‐plated copper sheet for electronic application
  • (12)Cross‐sectional examination of an anodized aluminum alloy for aerospace application
  • (13)Cross‐sectional examination of a porous anodic oxide film grown on a heterogeneous A1−Fe alloy
  • (14)Corrosion of an A1 2024−T3 alloy for aerospace application
  • (15)Cross‐sectional examination of an etched A1 foil for capacitor application
  • (16)On the nature of rf‐GD sputtering
  • (17)Precipitates in a stainless steel
  • (18)Ferrite precipitates in a low‐carbon stanless steel
  • (19)A novel used of rf‐GD suputtered surfaces for oxidation study of iron
  • (20)Micro‐structure of a Ti alloy
  • (21)Micro‐structure of a Ni‐based super alloy for aerospace application
  • (22)Cracks in a nitrogen‐doped stainless steel
  • (23)Sample surface preparation using rf‐GD sputtering for cross‐sectional examination
  • (24)Cross‐sectional examination of a galvanized steel for car bodies
  • (25)Cross‐sectional examination of a flash memory device
  • (26)Cross‐sectional examination of a multi‐layered glass
  • (27)Cross‐sectional examination of a copper sheet for electronic application
  • (28)Cross‐sectional examination of a nitrided carbon steel
  • (29)Cross‐sectional examination of deformed surface regions of carbon steel after shot peening
  • (30)Cross‐sectional examination of a thermal sprayed WC−18% Co coating on a titanium alloy
  • (31)Cross‐sectional examination of a thermal barrier coating on the Ni‐based super alloy for aerospace application
  • (32)On the possibility of the use of rf‐GD sputtering for follow‐up treatment of thin slices for TEM examination

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